CL-7100 series Measurement Examples

Conductor and Semiconductor Measurement Examples

Measurement of a silicon wafer
Thickness measurement during a running operation
Measurement of copper-clad laminated plates

 

 

Insulator Measurement Example (with CL-0740 Option Installed)

Example of the measurement of objects such as thin glass or crystal
Non-contact thickness measurement of film on a production line

Related information





Revised:2025/12/22