Which items can be measured by the VE series Gap Detector?
You can measure "displacement" if the material of the object to be measured is a conductor (metal, carbon, etc.) or a semiconductor (silicon wafer, etc.) You can also measure "thickness" of the object if you use two sensors.
| Conductor | Metal, conductive film, carbon, etc. |
|---|---|
| Semiconductor | Silicon wafer etc. |
Moreover, you can measure "thickness" of insulators such as thin film and glass wafers.
| Insulator | Glass and plastics such as polyethylene and polypropylene. (Objects which can be measured must be thin and composed of simple material evenly distributed throughout.) |
|---|
Revised:2011/04/18
