CL-5600 series Measurement example

CL-5600series
Measurement Examples

Conductor/semiconductor thickness measurement

Illustration (Measurement of a silicon wafer)

Illustration (Thickness measurement during a running operation)

Illustration (Measurement of copper-clad laminated plates)

Insulator thickness measurement
(when the CL-0300 option is installed.)

Illustration (Example of the measurement of objects such as thin glass or crystal)

Illustration (Non-contact thickness measurement of film on a production line)

webinfo