This product is discontinued / Replaced by CL-5610 Non-contact Thickness Meter (Click here)
  Ono Sokki Company, Ltd.


Replaced by CL-5610 series
HOME > Products Information > Discontinued > Non-contact Thickness Meter CL-2400
Non-contact Thickness Meter
CL-2400

for measurements on conductors & semiconductors
Outer Dimensions (PDF)

Photo (CL-2400 Non-contact Thickness Meter)

The CL-2400 is designed for measurements on conductors, such as aluminum discs, and semiconductors, such as silicon wafers. Thickness is measured as the material under measurement passes through the gap formed between two opposing gap sensors.

The CL-2400 can be used for static or running thickness measurements.  BCD output, RS-232C interface, and remote control inputs are provided for external control, analysis, and measurement automation. 

Specifications

Measurement items Thickness, gaps
Display 7-segments, 6-digit, green LED display, including units and error messages
Display modes Absolute value, max., min., max.-min. value 
Resolution Depending on VE series gap detectors to be combined (0.1 μm or 1 μm)
Parameter settings by key operation on the panel
can be stored in the internal memory and held in the power-off memory
Sampling time 20 ms
Averaging 1 to 16 times (moving averaging)
Real-time data processing Max., min., max.-min. values of measuring data are displayed in real time
Data initialized at the start and held at the stop.
Interface BCD 5-digit BCD data output
RS-232C displayed data and panel conditions
SYNC Input/output of clock for carriers in parallel operation of multiple CL-6200s.
Output printer via BCD output
external control Using external contact signals for
START/STOP, PAUSE, CALIBRATION START INPUT
Input specifications : photocoupler input
Operating temperature 0 to +40 °C
+18 to +28 °C (guaranteed accuracy range)
Humidity 20 to 80% R.H  * with no condensation
Power supply 100  to 240 VAC, 50/60 Hz, 30VA or less
Outer dimensions 210 (W) x 99 (H) x 350 (D) mm
Weight Approx. 3.7 kg

Revised: 2008/01/31


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