ONO SOKKI - CL-5600 series Measurement example

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CL-5600 series Measurement Examples

CL-5600 series
Measurement Examples

CL-5600 Main page

nConductor/semiconductor thickness measurement

Illustration (Measurement of a silicon wafer)

Illustration (Thickness measurement during a running operation)

Illustration (Measurement of copper-clad laminated plates)

nInsulator thickness measurement
(when the CL-0300 option is installed.)

Illustration (Example of the measurement of objects such as thin glass or crystal)

Illustration (Non-contact thickness measurement of film on a production line)